User Contributed                                           MET/CAL PROCEDURE
=============================================================================
INSTRUMENT:            Fluke 80i-400:AC Current Probe
DATE:                  31-Jan-95
AUTHOR:                User Contributed
REVISION:              0
ADJUSTMENT THRESHOLD:  70%
NUMBER OF TESTS:       12
NUMBER OF LINES:       119
CONFIGURATION:         Fluke 5700A
CONFIGURATION:         Fluke 5725A
CONFIGURATION:         Datron 1281
STANDARD:              DTB DJK-50T
=============================================================================
 STEP    FSC    RANGE NOMINAL        TOLERANCE     MOD1        MOD2  3  4 CON
  1.001  ASK-   R     N              P             M              F        W
  1.002  ASK+                                          X
  1.003  IEEE         [@1281]*RST
  1.004  IEEE         [@1281]ACI AUTO
  1.005  HEAD         ÍÍ INITIAL CONDITIONS ÍÍ
  1.006  DISP         Connect the DTB DJK-50T current loop to the
  1.006  DISP         5725A CURRENT OUTPUT.
  1.007  STD          DTB DJK-50T
  1.008  DISP         With the current direction arrow pointing down,
  1.008  DISP         clamp the UUT around the center of the coil.
  1.009  DISP         Connect the UUT's output to the I+ and I-
  1.009  DISP         inputs to the Datron 1281 DMM.
  1.010  HEAD         {}
  1.011  HEAD         {ÉÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍ»}
  1.012  HEAD         {º AC Current Test º}
  1.013  HEAD         {ÈÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍͼ}
  1.014  HEAD         ÍÍ AC Current Test ÍÍ
  1.015  DISP         ********Note********
  1.015  DISP         At higher currents it may be neccessary to reverse
  1.015  DISP         the direction of the probe to avoid overloads.
  1.016  JMP          2.001
  1.017  EVAL
  2.001  5700         1.00A                        60H               B1 S  2W
  2.002  ACC          50.000A        0.1%
  2.003  IEEE         [@1281][D2000]RDG?[I]
  2.004  MEM*         1000
  2.005  MEME
  2.006  MEMC         ÿA             3.00% 0.40U   60H
#!          Test Tol 0.43, Sys Tol 0.00057, TUR 754.386 (>= 4.00).
  3.001  5700         2.00A                        60H               B1 S  2W
  3.002  ACC          100.00A        0.1%
  3.003  IEEE         [@1281][D2000]RDG?[I]
  3.004  MEM*         1000
  3.005  MEME
  3.006  MEMC         ÿA             3.00% 0.40U   60H
#!          Test Tol 0.46, Sys Tol 0.00097, TUR 474.227 (>= 4.00).
  4.001  5700         3.00A                        60H               B1 S  2W
  4.002  ACC          150.00A        0.1%
  4.003  IEEE         [@1281][D2000]RDG?[I]
  4.004  MEM*         1000
  4.005  MEME
  4.006  MEMC         ÿA             3.00% 0.40U   60H
#!          Test Tol 0.49, Sys Tol 0.00137, TUR 357.664 (>= 4.00).
  5.001  5700         4.00A                        60H               B1 S  2W
  5.002  ACC          200.00A        0.1%
  5.003  IEEE         [@1281][D2000]RDG?[I]
  5.004  MEM*         1000
  5.005  MEME
  5.006  MEMC         ÿA             3.00% 0.40U   60H
#!          Test Tol 0.52, Sys Tol 0.00177, TUR 293.785 (>= 4.00).
  6.001  5700         5.00A                        60H               B1 S  2W
  6.002  ACC          250.00A        0.1%
  6.003  IEEE         [@1281][D2000]RDG?[I]
  6.004  MEM*         1000
  6.005  MEME
  6.006  MEMC         ÿA             3.00% 0.40U   60H
#!          Test Tol 0.55, Sys Tol 0.00217, TUR 253.456 (>= 4.00).
  7.001  5700         6.00A                        60H               B1 S  2W
  7.002  ACC          300.00A        0.1%
  7.003  IEEE         [@1281][D2000]RDG?[I]
  7.004  MEM*         1000
  7.005  MEME
  7.006  MEMC         ÿA             3.00% 0.40U   60H
#!          Test Tol 0.58, Sys Tol 0.00257, TUR 225.681 (>= 4.00).
  8.001  5700         7.00A                        60H               B1 S  2W
  8.002  ACC          350.00A        0.1%
  8.003  IEEE         [@1281][D2000]RDG?[I]
  8.004  MEM*         1000
  8.005  MEME
  8.006  MEMC         ÿA             3.00% 0.40U   60H
#!          Test Tol 0.61, Sys Tol 0.00297, TUR 205.387 (>= 4.00).
  9.001  5700         8.00A                        60H               B1 S  2W
  9.002  ACC          400.00A        0.1%
  9.003  IEEE         [@1281][D2000]RDG?[I]
  9.004  MEM*         1000
  9.005  MEME
  9.006  MEMC         ÿA             3.00% 0.40U   60H
#!          Test Tol 0.64, Sys Tol 0.00337, TUR 189.911 (>= 4.00).
 10.001  HEAD         {}
 10.002  5700         2.00A                        400H              B1 S  2W
 10.003  ACC          100.00A        0.1%
 10.004  IEEE         [@1281][D2000]RDG?[I]
 10.005  MEM*         1000
 10.006  MEME
 10.007  MEMC         ÿA             2.00% 0.40U   400H
#!          Test Tol 0.44, Sys Tol 0.00097, TUR 453.608 (>= 4.00).
 11.001  5700         8.00A                        400H              B1 S  2W
 11.002  ACC          400.00A        0.1%
 11.003  IEEE         [@1281][D2000]RDG?[I]
 11.004  MEM*         1000
 11.005  MEME
 11.006  MEMC         ÿA             3.00% 0.40U   400H
 12.001  IEEE         [@1281]*RST
#!          Test Tol 0.64, Sys Tol 0.00337, TUR 189.911 (>= 4.00).
 12.002  HEAD         {}
 12.003  DISP         {ÉÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍ»}
 12.003  DISP         {º THIS COMPLETES THE VERIFICATION º}
 12.003  DISP         {ÈÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍͼ}
 12.004  END
#! T.U.R.s less than 4.00:                  0
#! T.U.R.s estimated using RANGE value:     0
#! T.U.R.s not calculated (ASK- U):         0
#! T.U.R.s not computable at compile time:  0
#! FOR JUSTIFICATION REFER TO COMMENTS FOLLOWING EACH TEST IN THIS LISTING.